Scanning Electron Microscope

Feis Magellan extreme high-resolution scanning electron microscope (XHR SEM) allows scientists and engineers to quickly see 3D surface images at many different angles and at resolutions below one nanometer (about the size of ten hydrogen atoms, side-by-side). Most importantly, the microscope images samples at very low beam energies, avoiding distortions otherwise caused by the beam penetrating into the material below. The Companys TEM, SEM, and Dualbeam solutions were created specifically for materials science, life science, and mining.