Based on the unique Olympus FluoView FV1000 confocal Laser Scanning Microscope (cLSM), the MPE system is available in three models providing the highest penetration depths on the market. The systems are fully configured to ensure best excitation efficiency and thus imaging hundreds of microns into a specimen is possible for the first time.
Each model in the range uses IR femtosecond pulsed lasers and non-descanned detectors to cover every multiphoton excitation imaging requirement. The entry level model is designed to achieve maximum penetration depth with minimal complexity. The advanced models offer IR laser attenuation via an acousto-optical modulator (AOM). This enables sophisticated scanning and laser control modes such as region of interest imaging and fly back beam blanking. The third model incorporates the unique FluoView FV1000 SIM scanner. This system provides an independantly controllable, fully integrated second IR laser for simultaneous multiphoton imaging and multiphoton laser manipulation.
The use of lasers with sub-picosecond pulses for two-photon microscopy is protected by U.S. Patent No 5.034.613. This technology was integrated in Olympus laser scanning microscopes, Models FV1000MPE, under a license from Carl Zeiss MicroImaging GmbH and Cornell Research Foundation Inc.