PXI-based test solution from Rohde & Schwarz now with expandable analog in-circuit test
With the new version 2.3 of the enhanced generic test software library (EGTSL) for in-circuit tests, Rohde & Schwarz is expanding its Open Test Platform R&S CompactTSVP into an even more powerful multipurpose tester. The software provides a previously unavailable level of openness that lets users expand the test solution at any time by adding further test methods for new components. An automatic test generator and the intuitive graphical user interface enable you to implement error-free in-circuit test applications quickly without requiring much previous experience. The CompactPCI/PXI-based test platform thus makes it possible to perform configuration and function tests of electronic modules on one system.
The flexibility of the R&S CompactTSVP system platform in function tests, which is obtained by using Rohde & Schwarz measurement and switching modules as well as modules in accordance with the CompactPCI/PXI standard, is now also available for the in-circuit test. The R&S TS-PSAM module makes it possible to discharge electronic modules. Furthermore, you can perform contact, short-circuit and continuity tests as well as two- and four-pole resistor measurements. To integrate the entire in-circuit test function into the test platform, you need the In-Circuit Test (ICT) Extension Module R&S TS-PICT and the Power Supply Module R&S TS-PSU. The number of available test points can be selected in steps of 90.
The ICT program is generated by the automatic test generator (ATG), which calculates test suggestions for the relevant modules in XML format directly from the CAD data. The ATG automatically selects the relevant test and guard points and generates a wiring list. The intuitive, graphical debug user interface of R&S EGTSL allows you to optimize the ICT program highly efficiently. Knowledge of a special programming language or syntax is not necessary. The generated ICT program can be easily integrated into function test programs by means of only a few function calls of the EGTSL Runtime Library.
Since you can seamlessly integrate simple function tests or test methods that you develop yourself for new components, the new R&S EGTSL version makes it possible to perform even more powerful and versatile in-circuit tests .
The modules for the analog in-circuit test and associated R&S EGTSL software in version 2.3 are now available from Rohde & Schwarz.
The ICT program is generated by the automatic test generator (ATG), which calculates test suggestions for the relevant modules in XML format directly from the CAD data. The ATG automatically selects the relevant test and guard points and generates a wiring list. The intuitive, graphical debug user interface of R&S EGTSL allows you to optimize the ICT program highly efficiently. Knowledge of a special programming language or syntax is not necessary. The generated ICT program can be easily integrated into function test programs by means of only a few function calls of the EGTSL Runtime Library.
Since you can seamlessly integrate simple function tests or test methods that you develop yourself for new components, the new R&S EGTSL version makes it possible to perform even more powerful and versatile in-circuit tests .
The modules for the analog in-circuit test and associated R&S EGTSL software in version 2.3 are now available from Rohde & Schwarz.
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