09/07/2005 • Laboratory appliances

PANalytical Introduces MiniPal 4

The new energy-dispersive XRF bench-top spectrometer performs non-destructive analysis of elements from sodium to uranium, in concentrations from 100% down to ppm levels.

Successor to the MiniPal 2, the MiniPal 4 offers even greater levels of sensitivity and versatility. Featuring a new silicon drift detector, with currently the highest resolution in this market segment, it demonstrates twice the analytical performance of its predecessors, with higher accuracy and precision and much lower detection limits. A new version of software adds considerable flexibility for fast elemental analysis across the entire periodic table.

MiniPal 4 is one of the smallest full-function bench-top spectrometers currently available. With a mass of only 28 kg, it is configured with a 12-position sample changer, a helium gas attachment for liquids analysis and a selection of X-ray tube anodes for analytical flexibility. Installation and application set-up are further simplified by a Quick Start Guide that is supplied as part of the package.

The MiniPal 4 can analyse a variety of materials in the form of liquids, powders, bulk solids and surface layers. MiniPal 4 also offers a unique standardless-analysis feature for inspection or identification of unknown substances such as metals and its alloys. Based on theoretical models and specially developed algorithms, this allows quick analysis of unknown samples.
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