Thin-film Measurement

Laser 2000 offers integrated desk top solution for all thin film measurement needs: Aquila Instruments has designed a range of instruments to over-come the problems usually encountered when measuring the optical performance of thin-film coatings on transparent substrates. In conventional instruments problems arise from unknown incident polarisation and multiple reflections from the front and back surfaces of the substrate. Unless the measurement is made at normal incidence, this gives a multitude of transmitted and reflected beams, some of which may escape detection giving inaccurate results. The company's nkd-series spectrophotometers are designed specifically for analysis of thin-film coatings and offer accurate measurement of total transmittance and total reflectance in a precisely defined experimental geometry with known polarisation.