New Dual-View Atomic Spectrometer

Agilent Technologies introduced the 5100 Inductively Coupled Plasma – Optical Emission Spectrometer (ICPOES).

According to the manufacturer, the system runs samples faster, using less gas and without compromising performance on even the toughest samples. The new instrument is built for labs doing food, environmental and pharmaceuticals testing as well as mining and industrial applications. While conventional dual-view systems require up to four sequential measurements per sample, the new system requires only one, using Dichroic Spectral Combiner and Synchronous Vertical Dual-view technologies.

The instrument runs analyses 55 percent faster using 50 percent less gas per sample than competitive systems. Users can also capture all wavelengths in one. The system’s vertical torch will enable them to measure challenging samples like high matrix or volatile organic solvents.

Three configurations are available:

▪▪ Synchronous Vertical Dual View (SVDV) for fastest analyses and the lowest gas usage.

▪▪ Vertical Dual View (VDV) for high throughput applications is upgradable on-site to the SVDV configuration  if higher throughput is needed.

▪▪ Radial View for radial ICP-OES.