Particle Sizing

Fritsch Particle Sizing Instruments offers laser technology for various applications. A patented measuring method involving laser diffraction inside the convergent laser beam enables a simple continuous adjustment of the measuring area. With a measuring range of 10 nm to 2,000 µm the Analysette 22 NanoTec offers an entry into the nano range. This is achieved by using a second laser beam that is directed at the sample from behind, allowing for detection of the back-scattering light.

The patented capability to move the measurement cell within the beam path of the optical system during the measurement also results in a very high number of effective detection channels, which can be over 500 for the NanoTec model. This results in a high number of particle size classes and therefore a very high resolution. The special shape of the detector combined with intelligent evaluation software LaPaSS also allows information to be obtained about the particle shape.

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