Particle Sizing

FRITSCH Particle Sizing Instruments offer state-of-the-art laser technology for each particular area of application and utilization. The special, patented Fritsch measuring method by laser diffraction inside the convergent laser beam enables a simple continuous adjustment of the measuring area as well as up to now unknown number of measuring channels. The Analysette 22 NanoTec offers with the measuring range of 10 nm to 2000 µm true entry into the nano range. This is achieved through the use of a second laser beam that is directed at the sample from behind, allowing for detection of the back-scattering light.

The patented capability to move the measurement cell within the beam path of the optical system during the measurement also results in a very high number of effective detection channels, which can be over 500 for the NanoTec model, which leads to a correspondingly high number of particle size classes and therefore a very high resolution. The special shape of the detector combined with intelligent evaluation software MaS control also allows information to be obtained about the particle shape.

Whitepaper-Download (1.73 MB)