Super-Resolution Microscopy

Andor Technology reported that their performance leading ixon+ EMCCD cameras have been used in the development of a new structured illumination microscopy approach that delivers sub-diffraction resolution at high speed. The instrument has been developed by a team from the University of San Francisco, led by Prof. John Sedat, Assist. Prof. Mats Gustafsson, and Dr. David Agard. It is based on the employment of diffracted laser light to create a pattern of multiple interfering illumination beams. Capture of images over several orientation of the beams incident on the sample, followed by intensive computational treatment, results in a final image with spatial resolution that is at least twice as fine as the 200300nm best case resolution of classical microscopy.