10/13/2003 • Microscopy / Imaging

Microanalysis System

Röntec's microanalysis system QuanTax uses LN2-free XFlash detectors with throughput capabilities of 1 million cps and a resolution of 127 eV at Mn Ka. Compared to conventional Si(Li)-technology, analyses - including light element detection - can be carried out up to 5x faster, mapping up to 10x faster. Visit our booth at the DGE's 31st Microscopy
Conference in Dresden (Sept. 7-12) or at Munich's Materialica (Sept. 16-18; booth B5.300) to find out more about this
exciting new technology.
This product information
is expired!

Use our search-function for current products ...
gradient arrows

Röntec GmbH

Schwarzschildstr. 12
12489 Berlin

Phone: 030/670990-0
Fax: 030/67099030