White Light Interferometer (WLI)
The WLI unit and a wide range of interference optics developed and manufactured by Mitutoyo ensure that a highly accurate sensor can be used reliably and robustly in industrial applications.
The demands on measurement technology in terms of accuracy, resolution and speed are constantly increasing. Non-contact measurement of surfaces with height differences in the nanometer range is increasingly required in order to be able to evaluate even the smallest topographies or roughness.
Mitutoyo's WLI unit and a broad range of interference optics developed and produced in-house enable reliable and robust industrial use of a highly accurate sensor that meets these requirements. The compact design and comprehensive programming interface offer a high degree of flexibility and make it possible to integrate this technology into your own systems, thereby making it available to users.
Optical metrology exploits the different physical properties of light to push the limits of what can be measured. A white-light interferometer uses the wave nature of light to detect height differences with a resolution in the nanometer range using an area sensor. This opens up possibilities for the evaluation of microscopic topographies and non-contact roughness measurement in numerous application environments.
