Rigaku Introduces nano3DX True X-ray Microscope

Rigaku has introduced the nano­3DX true X-ray microscope (XRM) with the ability to measure relatively large samples at high resolution. The XRM images the entire sample from multiple angles. In doing so, it can reconstruct a 3D image at 0.27 µm resolution.

The computer model allows the user to view sections at any point on any plane, providing valuable insights into the structure of the sample. The combination of high-power rotating anode and high-resolution optics coupled with sub-micron CCD technology is capable of fast data collection and has the ability to switch anode materials rapidly to optimize data acquisition. Furthermore, the magnification occurs in the detector using true
microscope elements.