The Axio CSM 700 confocal microscope from Carl Zeiss meets users demands for rapid and robust non-contact measurement of 3D microstructures and determination of surface roughness. Suited for materials research, quality inspection and routine applications, the microscope displays surfaces three-dimensionally in high resolution and in true colour even on relatively soft surfaces. The optics allow topographical measurements to be performed at up to 117 frames per second. Step heights from approx. 20 nm up to the millimeter range are detected at a depth of focus previously only possible with the scanning electron microscope.