iC-MF L/N/P: 8-channel fail-safe FET driver
iC-MFL, iC-MFN and iC-MFP are monolithically integrated, 8-channel level adjustment devices which drive Logic FETs, N- and P-Channel Power FETs. The internal circuit blocks have been designed in such a way that with single errors, such as open pins (VB, VBR, GND, GNDR) or the short-circuiting of two outputs, iC-MF L/N/P's output stages switch to a predefined, safe state. Externally connected FET are thus shut down safely in the event of a single error.
The typical applications are driving FETs from 1.8 V, 3.3 V or 5 V TTL- and CMOS-compatible systems as are FPGAs, modern microcontroller and microprocessor with "fail safe"-requirements of the device.
The inputs of the eight channels consist of a Schmitt trigger with a pull-down current source and are compatible with TTL and CMOS levels (1.8 V, 3.3 V or 5 V) and are voltage-proof up to 40 V. Pull-down currents provide the safe lo-level at open inputs and the pull-down currents have two stages in order to minimize power dissipation with enhanced noise immunity.
Should the supply voltage at VB undershoot a predefined threshold, the voltage monitor causes the outputs to be actively tied to the off state. If the supply voltage or the ground connection ceases, the outputs regardless reach the safe off state.
Even two outputs of different logic states are short circuited, the active driving FET with a high signal, the off state driver predominates, keeping the connected FETs in a safe shutdown state. The status of the device is indicated with the Open-Drain pin NOK and can be used for system diagnostics of individual channels.
The devices are protected against destruction by ESD. Temperature monitoring protects the devices from too high power dissipation. The devices operate from -40 °C to 125 °C and are available in a ROHS conform QFN24 package.
The typical applications are driving FETs from 1.8 V, 3.3 V or 5 V TTL- and CMOS-compatible systems as are FPGAs, modern microcontroller and microprocessor with "fail safe"-requirements of the device.
The inputs of the eight channels consist of a Schmitt trigger with a pull-down current source and are compatible with TTL and CMOS levels (1.8 V, 3.3 V or 5 V) and are voltage-proof up to 40 V. Pull-down currents provide the safe lo-level at open inputs and the pull-down currents have two stages in order to minimize power dissipation with enhanced noise immunity.
Should the supply voltage at VB undershoot a predefined threshold, the voltage monitor causes the outputs to be actively tied to the off state. If the supply voltage or the ground connection ceases, the outputs regardless reach the safe off state.
Even two outputs of different logic states are short circuited, the active driving FET with a high signal, the off state driver predominates, keeping the connected FETs in a safe shutdown state. The status of the device is indicated with the Open-Drain pin NOK and can be used for system diagnostics of individual channels.
The devices are protected against destruction by ESD. Temperature monitoring protects the devices from too high power dissipation. The devices operate from -40 °C to 125 °C and are available in a ROHS conform QFN24 package.
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