Silicon Drift Detector

Edax has launched the Apollo XV SDD, the latest generation of silicon drift detectors for X-ray microanalysis. Our latest addition to our Apollo Series SDD provides additional solutions for the X-ray microanalysis market by offering superior energy resolution and light element performance, explains Del Redfern, Product Marketing Manager. The system utilizes the latest generation SDD chip technology leading to superior performance specifications, including energy resolutions of <128eV @ Mn K and <52eV @ C K, adds Redfern. The detector expands the companys portfolio of silicon drift detectors for all X-ray microanalysis applications, including accurate qualitative and quantitative analysis, fast and ultra fast X-ray mapping, phase analysis and complex particle analysis.