01/02/2008 • Automation • Image processing / Optical metrology • Metrology

Optical Devices for 3D Surface Measurement

PhaseView announces new features on its popular optical devices used for 3D surface measurement. Both models MicroPhase and SurPhase now integrate color visualization and processing for better defaults discrim­ination and 3D analysis. Extended dynamic range capability allows a large Z measurement scale while keeping high precision. New hardware design now makes possible 3D measurement not only in microscopic scale but also in macroscopic mode for large samples. The software interface integrates new 3D measurement functions offering a comprehensive set of 3D analysis tools. Based on PhaseViews patented Digital Phase Technology, SurPhase and MicroPhase are ideal tools for surface characterization and 3D measurements such as profiles, heights, roughness and waviness parameters.

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Phaseview

7, rue de la Croix Martre
91220 Palaiseau

Phone: +33 (0) 1 69 32 12 78