09/05/2007 • Laboratory appliances

Transmission Electron Microscope for High Contrast

Jeol introduces its new 120kV high resolution Transmission Electron Microscope (TEM). This instrument, the model JEM-1400, is optimized for biological, polymer, and materials research. High contrast resolution is assured at 0.38nm point-to-point and 0.2nm lattice images. The TEM can be quickly configured for either high contrast imaging or scanning transmission electron microscope (S/TEM) analysis. A micro-precision, drift-free Piezo goniometer stage provides superior sample positioning and a tilt range of +/70° for detailed 3-D tomography.

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Jeol USA Inc.

11 Dearborn Rd.
MA 01960 Peabody

Phone: +1 978/ 535- 5900
Fax: +1 978/ 536- 2205/2206