First UK Showing for S-4800 FESEM

The S-4800 FESEM from Hitachi High-Technologies can be seen for the first time in the UK at Microscience 2004. The instrument combines large (8" diameter) sample handling
capabilities with the image resolution (1.0 nm at 15 kV) normally associated with in-lens scanning electron microscopes (SEMs). For beam-sensitive samples, a new beam deceleration option allows resolution of just 1.4 nm to be achieved at 1 kV. The S-4800 has exceptional signal collection capabilities through enhanced E X B filter technology which gives outstanding backscattered electron images even at accelerating voltages below 2 kV.
Also on show will be the S-3600N variable pressure SEM, which will be on the PGT stand, H2. The S-3600N is characterised by its extremely large specimen chamber and sampling handling capabilities.