Portable Atomic Force Microscope

Windsor Scientific introduces the Nanosurf Mobile-S portable Atomic Force Microscope to join the family of scanning probe microscopes, including the E-Line STM & AFM and the DFM instruments. The new microscope brings the technology for three-dimensional measurement at the sub micron level to a larger user base and also satisfies the need for a more compact instrument. To make the instrument an easier instrument to use, there are several innovative features to help the user achieve good topographical data without long set up times. Further new features include a single electronics control box with a USB interface to the PC, an inbuilt video, and two different scan heads – one for imaging at the angstrom level and another for scanning over a larger area with possible sample curvature.