Have a Close Look at Your Tip
Don't go fishing in the dark any longer: with in-situ TEM sample probing you can actually watch live what your SPM tip is doing on your sample. Choose a suit-able position via TEM imaging and manipulate your sample while watching with your TEM. Bending or breaking nanotubes, measuring electrical properties of nanoscale objects, doing hardness testing with our new nanoindenter; it can all be done within your TEM. Watch the mass flow when you approach two gold tips or use nanotubes as nanopipettes or.... By the way, you can use it as an ordinary SPM as well.
Example: Conductance of Carbon Nanotubes
Multiwall nanotubes with an iron core are glued to a silver wire and imaged in the TEM with a STMHolder. A mechanically cut gold probe is gently put in contact with a single nanotube. The current between the probe and the nanotube is measured as a low bias is applied. Once a low resistance contact is established, I-V curves are recorded. The position of the probe is adjusted to reach the iron core or different parts of the sidewalls. Distinct nanotubes can be selected, characterised and probed with the same probe. Changes of the probe and the nanotube are documented with TEM images.Features:
- Holders available for most side entry TEMs
- STM single and double tilt holders
- Nanoindenter holders
- AFM holder (currently under development)
- New 3-D approach mechanism
- State-of-the-art control system
- Software for control and data aquisition
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