03/19/2004 • Microscopy / Imaging

Element Imaging System

Visit booth A4.217 at the Analytica for a demonstration of Röntec's ColorSEM. Integrated into the Quantax microanalysis system. This element imaging system generates element images based on X-rays within several minutes. The acquisition is up to 10 times faster than with conventional Si(Li)-technology. ColorSEM uses the Röntec Xflash detector technology. The Xflash doesn't require LN2 for cooling and has processing capabilities of up to 1 million cps. It detects all elements from Carbon to Uranium.
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Röntec GmbH

Schwarzschildstr. 12
12489 Berlin

Phone: 030/670990-0
Fax: 030/67099030