Large Chamber for High Performance Variable Pressure SEM

The Hitachi S-3600N is designed for applications where sample size and weight are as important as image performance. The specimen chamber will accommodate samples as large as 10 inch dia., weighing as much as 2 kg. It allows the study of wet, oily, non-conductive samples without metal coating or other tedious sample preparation. This is the perfect platform for a combination of high
performance imaging and analytical techniques,
such as EDS, WDS, EBSD and CL.

Hitachi's Scanning Electron Microscopes

Hitachi's Scanning Electron Microscopes and Field Emission Scanning Electron
Microscopes offer an optimal platform for high-resolution surface imaging. Together with modern analytical techniques it is an indispensable tool for research and science,
development and quality control.


Features:

• 3.0 nm at 25 kV (SE, high vacuum mode)
• 15 mm at 3 kV
• 4.0 nm at 25 kV (BSE, low vacuum mode)
• Magnification: x5 - x300,000 (153 steps)
• Max. specimen size: 10 inches (254 mm) dia.
• Max. specimen height: 70 mm (WD=5mm)
• Max. specimen weight: 2 kg
• Accelerating voltage: 0.3-30 kV

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