Atomic Force and Scanning Tunnelling

The E-Line product range of Scanning Tunnelling and Atomic Force Microscopes is launched in the UK by Windsor Scientific. Both microscopes are aimed at the educational market place and also low cost ownership for researchers. The E-AFM typically allows the user to scan the topography of non-conducting surfaces using a standard scanner of approximately 70µ in X,Y and 20µ in Z. As the scanner uses electromagnetic actuators to position the tip, no high voltages are required, which means that low voltages give the instrument the capability of portability and make it very compact. Ease of use is further highlighted by the application of self aligned scanning tips that require no adjustment.