Delong America has released its LVEM25 compact electron microscope. It is built on the same miniature platform as the LVEM5 benchtop TEM.
With it’s variable voltage (6-25kV) and high-resolution imaging capabilities the instrument is able to work with biological and polymer thin sections that are prepared by standard procedures for conventional TEM and is well suited for applications in virology and pathology as well as nanomaterial research.
The electron microscopes can accommodate up to three imagining modes (TEM, STEM, and electron diffraction) and allow for effortless transitioning between modes. The operations are straightforward, and routine procedures such as column alignment don’t require unreasonable effort and time. Downtime is further minimized by quick sample exchange.