Nanoscale Chemical Mapping System

Bruker’s Inspire is an inte­grated scanning probe micros­copy (SPM) infrared system for 10-nanometer spatial resolution in chemical and materials prop­erty mapping.

The system in­corporates the Company’s pro­prietary Peak Force IR mode to enable nanoscale infrared reflection and absorption mapping for a wide range of applications, including the characterization of mi­crophases and their interfaces in polymer blends, plasmons in the two-dimensional electron gas of graphene, and chemical hetero­geneity in complex materials and thin films.

The system features sensitivity down to molecular monolayers, even on samples not amenable to standard atomic force microscopy techniques.