Rigaku has released the Smartlab 3 system, a versatile multipurpose X-ray diffractometer with built-in intelligent guidance. A guidance software recognizes installed components and seamlessly integrates them into data collection and data analysis methods.
The cross beam optics module offers permanently mounted, permanently aligned and user selectable optical geometries for various diffraction experiments. As an example, one can choose a Bragg-Brentano and parallel beam combination for measurements of both powders and thin films without the need for instrument reconfiguration. The fifth, or in-plane, axis of the diffractometer allows the measurement of structures that are in the surface plane of the sample. This enables the measurement of extremely thin films and depth profiling in coatings.