High Resolution Field Emission Scanning Electron Microscope

Tescan´s newest generation FESEM platform delivers high-resolution performance, ease of use by design, and unparalleled throughput for the most challenging materials. True to all Tescan electron microscopes, the Maia FESEM provides the most analytical and scanning mode flexibility with no compromises. Various chamber designs allow full customization for specific application requirements.

The platform excels at low voltage observation and related analysis and incorporates numerous electron optical schemes contributing to outstanding low voltage performance and flexibility down to 50 volts.