3D Surface Metrology Solution

Leica´s DCM8 is a combined confocal and interferometric optical profiler and therefore provides the benefits of both technologies: high definition confocal microscopy for high lateral resolution up to 140 nm and interferometry to reach sub-nanometer vertical resolution.

Both techniques can be important for surface analysis of materials and components across numerous research and production environments. Surfaces that are made up of intricate structures with highly sloping areas demand lateral resolution of a few microns. In contrast to this, polished super-smooth surfaces with critical micro peaks and valleys require vertical analysis on the nanometer scale.