Nanolane Introduces Sarfus Mapping Stations for Real-Time Sample Characterization at Nanoscale

Sarfus Mapping LR and Sarfus Mapping HR from Nanolane are label-free analytical intruments for real-time sample characterization at nanoscale. Based on the Surface Enhanced Ellipsometric Contrast microscopy, this new generation of tools not only tracks changes at surface but also offers live visualization with high lateral resolution and thickness measurements (from 0.1 to 300 nm).

This provides new information for understanding surface phenomena such as molecular interactions, layer morphological changes, biofilms build-up and many more. Sarfus Mapping LR is especially suited for fast and routine analyses in air. Sarfus Mapping HR is the high-grade equipment for advanced research studies in air and in liquid.