Redesigned Optical 3D Profilometer

The popular Sensofar optical profilometer has been upgraded with a variety of new features and is now sold by Schaefer-Tec under the name Sensofar S neox. As before, the instrument still offers the two measurement methods Confocal and Interferometry, in order to cover a maximum of applications.

New is the choice of four wavelength sources for the illumination as well as a larger CCD chip, leading to even higher lateral resolution, an about 50% larger field of view and crystal clear colour images. The software has seen a slight redesign, integrating now the ISO 25178 norm for surface roughness measurements. Please contact your nearest Schaefer office to find out about more new features.
 

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