NanoTracker 2 from JPK Instruments is a ready-to-use optical tweezers system for quantitative measurements. This system meets the needs of all people who are working with small particles interacting with their environment - and measuring their forces. This optical tweezers platform provides force and interaction measurement in parallel with optical microscopy using complementary spectroscopic techniques.
It comes with an overall improved performance especially for the beam steering through highly accurate pivot-point piezo mirrors and the detection system which benefits from a complete redesign of the optical pathway. The resulting better linearity and diminished crosstalk improve all sensitive force measurements. New functions are also implemented for a more precise trap calibration which allows the extraction of additional material properties.