The Tescan Integrated Mineral Analyzer TIMA is a fully automated, high throughput, analytical scanning electron microscope which is designed specifically for the mining and minerals processing industry. The solution addresses applications such as mineral liberation analysis, process optimization, remediation, and search for precious metals and rare earths.
TIMA measures modal abundance, size-by-size liberation, mineral association, and performs PGM search automatically on multiple samples of grain mounts and thin or polished sections. A completely integrated EDX system accomplishes full spectrum imaging at very fast scan speeds. The image analysis is performed simultaneously with SEM backscatter electron images and a suite of X-ray images.