01/17/2011 • Laboratory appliances • Microscopy / Imaging

Ultra-High Resolution Field-Emission SEM

With the Nova NanoSEM 50 series, FEI Company is introducing a series of ultra-high resolution scanning electron microscopes (UHR SEMs).In addition to the combination of advanced optics (including a two-mode final lens), SE/BSE (Secondary Electrons/Backscattered Electrons) in-lens detection and beam deceleration, the Nova NanoSEM 50 series introduces a new suite of latest generation, high sensitivity retractable SE/BSE and STEM detectors, as well as versatile SE/BSE filtering capabilities, to optimize the information of interest. Intelligent scanning modes are available to minimize imaging artefacts.

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FEI Technologies Inc.

Achtseweg Noord 5, Bldg AAE
5651 GG Eindhoven

Phone: +31 (0)40/2766-768
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