Optical Emission Spectrometer

Spectro has presented its Spectro Arcos 165 for the first time at Jaima Expo. The optical emission spectrometer with inductively coupled plasma (ICP-OES) records the elemental spectrum between 165 and 770 nanometer for every measurement; making it especially suited to challenging tasks in environmental analysis.

The system rounds out the ICP-OES analyzer product series between the flagship Spectro Arcos and the entry-level Spectro Genesis. The engineering of the system “is based completely on the high-end components utilized in our flagship Arcos system and achieves exactly the same detection limits, the same precision and equally reproducible results,” explains Olaf Schulz, the manufacturer’s Product Manager for ICP-OES spectrometers. The optical system is the only difference between the models: While the Arcos records the entire spectrum starting at 130 nanometers for every measurement, the trimmed down Arcos 165 measures the wavelength range beginning at 165 nanometers.