New Solution for Gunshot Residue Analysis

FEI Company announced the release of two dedicated scanning electron microscopes (SEMs) and a new software package for automated analysis of gunshot residues (GSR). The GSR S50 and GSR F50 SEMs include the released Magnum GSR software and specially-modified hardware to provide fully-automated analysis with novel improvements in speed, accuracy and affordability. GSR analysis uses high-resolution SEM imaging to locate residue particles, and X-ray spectrometry to determine their elemental composition.