Confocal and Interferometer Profiler in one

Schaefer-Tec launched the new Sensofar PLµ NEOX optical profiler that combines the complementary measuring methods confocal and interferometry in one instrument.

The integrated piezo scanner provides a vertical resolution of down to 0.01nm in the Phaseshifting Interferometry mode while the linear stage allows for up to 40 mm vertical scanrange.

Sensofars patented microdisplay-based confocal scanning technology works without moving parts and guarantees a very long lifetime without maintenance.