Accessory for NanoWizard

The new conductive AFM module for JPKs NanoWizard II AFM maps local conductivity changes. Operating in contact, intermittent contact and spectroscopy modes, applications include charge mapping in polymers, organic semiconductors, nanotubes and nanoparticles. The module records the current flowing between an electrically conductive cantilever (typically Pt/Ir or Cr/Pt) and substrate while a bias is applied between tip and sample. It attaches directly to the base of the NanoWizard head. Conductivity mapping can be carried out in both contact and intermittent contact modes, under ambient or oxygen-free conditions, whilst simultaneously displaying the surface topography image.