Sample Preparation

lift-out techniques have become more reliable methods for preparation of samples requiring TEM and atom probe inspection. But they remain considerably more expensive than ex-situ lift-out techniques and require valuable time on the FIB. Kleindiek Nanotechniks answer is the Lift-out Shuttle. The shuttle contains a microgripper which is used to first contact and then securely hold the pre-cut sample. This then allows the sample to be easily freed from the bulk material by simply dropping the substage. This can all be carried out
with the help of a light microscope. The whole assembly is then transferred to the vacuum ready SEM or FIB via the loadlock. These steps may be repeated for multiple samples without breaking vacuum.