03/05/2009 • LIMS / Laboratory IT

Surface Topography Module

Carl Zeiss has presented an enhanced topography module for its AxioVision 4.7 image analysis software. For users of stereomicroscopes, new functions simplify and improve the microscopic measurement of surface roughness and the heights of microstructures, resulting in very detailed images. The roughness values from unfiltered primary profiles, highpass-filtered roughness profiles and lowpass-filtered waviness profiles can now be determined and an unlimited number of profile lines can be drawn and compared in the image. Height measurements have also been optimized. Users may specify the cut-off wavelength for Gaussian filtering of the calculated height chart. A motorized focus system is no longer required as height images of stereo image pairs of an object can now be calculated on the stereomicroscope, using a dual phototube and two cameras.

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Carl Zeiss MicroImaging GmbH

Carl-Zeiss-Promenade 10
07745 Jena

Phone: +49 (0) 3641/64-0
Fax: +49 (0) 3641/64-2941