UV/VIS/NIR Spectrometer for Film Thickness Measurements
tec5 supplies high-quality OEM components and compact, high-end UV/VIS/NIR spectrometer systems for thin film measurements based on diode-array and fiber-optic technology. Single and dual layers in the range of 0.1 to 100µm geometrical thickness can be determined at high rates.
The instruments of the MultiSpec series in 19“ housings can be easily fitted to a process installation. For laboratory use the Evaluation Line series is a reasonable priced solution, as well for mobile applications. The used MMS spectral sensors from Carl Zeiss guarantee an outstanding wavelength reproducibility and therefore high precision thickness data.
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