Electron Backscatter Diffraction Detectors

Edax has launched the Digiview IV, the latest generation electron backscatter detector (EBSD). Designed to serve a wide range of EBSD applications it can obtain orientation mapping data using the companys proprietary OIM software at rates up to 150 indexed patterns per second, with improved sensitivity and contrast. It can also be used for Phase Identification using the Genesis and Delphi software applications and produce high-resolution images. The detector fits seamlessly into the producers family of materials characterisation tools, effortlessly integrating with its EDS detectors and its technology-leading WDS system.