Bruker AXS Microanalysis introduced Esprit Feature at Microscopy and Microanalysis 2008. This new particle analysis software is designed for the companys Quantax EDS analysis systems. Esprit Feature utilizes the Quantax image digitizers and the XFlash EDS Detectors speed for fast, flexible particle identification and chemical classification. Among its powerful image analysis functions are configurable feature detection, a convenient review function as well as chart and report generation. Another attractive characteristic is its automatic unattended analysis of large samples or areas by preset methods for detection, classification and result handling.