Brandnew: JEOL JIB- 4500 Multibeam Tomography Tool

The newly developed JIB-4500 Multibeam is an integrated solution for high resolution SEM sample anaylsis and focused ion beam (FIB) sample modification and preparation.

A broad range of automated functions simplifies routine operations like manufacturing and observing precise cross sections of samples or TEM lamella preparation. Various lift out systems allow combined preparation using the unique JEOL IonSlicer to obtain outstanding TEM samples.

Intuitive operation of the JIB-4500 Multibeam system minimizes training of operators and the new multiview mode allows direct observation in the SEM while etching with FIB.

Various systems allow ion beam deposition as well as electron beam deposition to protect, to etch or to contact various parts of a device.