FRITSCH Particle Sizing

FRITSCH Particle Sizing Instruments offer state-of-the-art laser technology for each particular area of application and utilization. The special, patented FRITSCH measuring method by laser diffraction inside the convergent laser beam, characterises this system. A simple continuous adjustment of the measuring area as well as up to now unknown number of measuring channels offers advantages. With the different systems COMPACT, MicroTec, MicroTec XT and NanoTec and the possibility to combine corresponding components, a measurement system can configured that is precisely adapted to the application.

With the ANALYSETTE 22 COMPACT for example, FRITSCH provides a solution for sample materials in the particle size range from 0.3 to 300 µm who require a particularly easy-to-use bench model instrument with an extremely attractive price-performance ratio. With the ANALYSETTE 22 NanoTec, FRITSCH offers the option of shape analysis as well as a measurement range from 2000 µm down to 0.01 µm – the entry into the nano range.