Trace Elemental Analysis

Bruker AXS launched the S2 Picofox, a portable ultra-sensitive benchtop TXRF System to quantify elemental concentrations from 0.1 ppb to % levels. It previously was limited to floor standing, large lab systems for semiconductor and coatings metrology. The system was made for the analytical laboratory and for field use thus enabling TXRF ultra-high sensitivity elemental analysis in clinical, nutritional, environmental and mining applications for the first time. It offers Zero-wait sample prep, that does not require time-consuming digestion by hazardous chemicals. In contrast to AAS/ICP instrumentation, it is suitable for almost all sample types such as liquids, suspensions, filters, particles and body fluids. The system is equipped with a 30mm2 Xflash detector, making use of the companys Silicon Drift Detector (SDD) technology.