JPK Instruments introduces a new technical breakthrough that enables the combination of upright microscopy with atomic force microscopy (AFM) on the same sample spot the BioMAT Workstation. This clears the way for a new range of applications where the full capabilities of both AFM and advanced optical imaging can be realized even on opaque samples. A patented calibration procedure ensures that the region of interest can be found and re-imaged with micron precision, so exactly the same area can be investigated optically and with the AFM.