QUANTAX fast, reliable and convenient microanalysis

Bruker AXS Microanalysis QUANTAX EDS system delivers fast reliable analyses across a broad range of applications for all kinds of samples ranging from powders and metals to coatings. Its LN2-free XFlash® Silicon Drift Detectors (SDD) are vibration and maintenance free, while delivering unbeatable energy resolution at high count rates (125 eV Mn K? 100,000 cps).

The SDD technology makes real time spectrometry for instant element preview, high speed element mapping or Colorscan possible. Just one click and Colorscan turns the black and white SEM image into a full color image. While the SEM is scanning the image is superimposed in color with the element information gathered by the detector. In this way the user can assess interesting areas and the homogeneity of a sample at a glance.

Especially noteworthy is the QUANTAX HyperMap function. It stores a complete spectrum at every pixel of an element map. This database can be reanalyzed anytime later for additional elements or features of interest. Only the XFlash® detectors high count rate detection capability (>750,000 cps for the XFlash® 4010 and >3,000,000 cps for the XFlash® QUAD 4040) allows for efficient and fast HyperMapping.

• Designed for high resolution FE-SEMs
• Best resolution ever – 123 eV at 100,000 cps (Mn Kα)
• Superb light element performance (C Kα ≤ 46 eV, F Kα ≤ 54 eV)
• Detection from beryllium (4) to americium (95)
• LN₂, vibration and maintenance free
• XFlash® SDDs are available with 10, 30 and 40 mm2 active area
• Worldwide most comprehensive atomic data library now includes N-lines