Transmission Electron Microscope for High Contrast

Jeol introduces its new 120 kV high resolution Transmission Electron Microscope (TEM). This instrument, the model JEM-1400, is optimized for biological, polymer, and materials research. High contrast resolution is assured at 0.38 nm point-to-point and 0.2 nm lattice images. The TEM can be quickly configured for either high contrast imaging or scanning transmission electron microscope (S/TEM) analysis. A micro-precision, drift-free Piezo goniometer stage provides superior sample positioning and a tilt range of +/70° for detailed 3-D tomography.