High Resolution Electron Microscopes at Pittcon 2007

FEI Company will showcase the latest scanning electron and DualBeam (SEM/FIB) microscopes at Pittcon 2007. FEIs Quanta 3D SEM (scanning electron microscope) offers a flexible solution for structural diagnostics on any sample. The Quanta features three imaging modes in a single, integrated system: high vacuum, low vacuum and ESEM. The ESEM mode makes it possible to collect data on any sample, regardless of heat, moisture or dirt levels. The Quanta DualBeam also features focused ion beam (FIB) capabilities for precise cross sectioning to reveal sub-surface structures and features. FEIs new Inspect SEM Series combines ease-of-use with versatility to enable high-resolution imaging of a broad range of sample types. It is built on an affordable platform that supports both high- and low-vacuum imaging. Analytical capabilities can be added to both the Quanta and Inspect systems for acquisition of the maximum specimen data, including EDS, EBSD, WDS, and more.